Surface analysis
Scientific Services offers a wide range of specialised surface analysis
techniques. Major facilities include:
Quantitative Evaluation of Materials using a modified Scanning
Electron Microscope (QEMSCANŽ)
This fully automated instrument provides new capabilities for rapid
characterisation of minerals and non-crystalline phases with distinct
elemental composition. The system is able to measure thousands of points
on a sample within seconds and display compositional images.
Scanning Electron Microscopy (SEM)
SEM is a powerful technique that can give high depth of field
topological images of highly magnified surfaces. When equipped with a
backscattered electron detector and an energy dispersive x-ray (EDX)
spectrometer, regions of different composition can be identified and
characterised.
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
ToF-SIMS is an analytical technique used to image and record organic and
inorganic mass spectral data of solid materials. It is a highly
sensitive technique that provides chemical information regarding
elemental, isotopic and molecular structure.
Xray Photoelectron Spectroscopy (XPS)
XPS is a non destructive surface sensitive tool used to identify and
quantify the elements on the surface of materials and determine the
speciation of these elements. The depth of analysis is between 10 and 20
nm into the surface of the sample. The XPS operates by exposing the
material to xrays and measuring the kinetic energy of photoemitted
electrons.